Nuclear chemistry progress report
This is the annual progress report for the Indiana University nuclear chemistry program for the 1992/1993 year. Accomplishments include the construction, testing, and initial experimental runs of the Indiana Silicon Sphere (ISiS) 4{pi} charged particle detector. ISiS is designed to study energy dissipation and multifragmentation phenomena in light-ion-induced nuclear reactions at medium-to-high energies. Its second test run was to examine 3.6 GeV {sup 3}He beam reactions at Laboratoire National Saturne (LNS) in Saclay. The development and deployment of this system has occupied a great deal of the groups effort this reporting period. Additional work includes: calculations of isotopic IMF yields in the {sup 4}He + {sup 116,124}Sn reaction; cross sections for A = 6 - 30 fragments from the {sup 4}He + {sup 28}Si reaction at 117 and 198 MeV; charging effects of passivated silicon detectors; neck emission of intermediate-mass fragments in the fission of hot heavy nuclei.
- Research Organization:
- Indiana Univ., Bloomington, IN (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- FG02-88ER40404
- OSTI ID:
- 10110902
- Report Number(s):
- DOE/ER/40404--5; ON: DE94004716
- Country of Publication:
- United States
- Language:
- English
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440103
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
663440
663470
663510
663530
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73 NUCLEAR PHYSICS AND RADIATION PHYSICS
A = 1-5
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D-, T-, AND HE-INDUCED REACTIONS AND SCATTERING
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GEV RANGE 01-10
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MEV RANGE 100-1000
NUCLEAR FRAGMENTATION
NUCLEAR SPECTROSCOPIC INSTRUMENTATION
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SILICON 28 TARGET
TESTING
TIN 116 TARGET
TIN 124 TARGET
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
663440
663470
663510
663530
663560
73 NUCLEAR PHYSICS AND RADIATION PHYSICS
A = 1-5
A = 20-38
A = 90-149
ALPHA REACTIONS
CROSS SECTIONS
D-, T-, AND HE-INDUCED REACTIONS AND SCATTERING
DESIGN
FISSION
GEV RANGE 01-10
HELIUM 3 REACTIONS
MEV RANGE 100-1000
NUCLEAR FRAGMENTATION
NUCLEAR SPECTROSCOPIC INSTRUMENTATION
PROGRESS REPORT
SI SEMICONDUCTOR DETECTORS
SILICON 28 TARGET
TESTING
TIN 116 TARGET
TIN 124 TARGET