Emissivity corrected infrared method for imaging anomalous structural heat flows
Patent
·
OSTI ID:100990
A method for detecting flaws in structures using dual band infrared radiation is disclosed. Heat is applied to the structure being evaluated. The structure is scanned for two different wavelengths and data obtained in the form of images. Images are used to remove clutter to form a corrected image. The existence and nature of a flaw is determined by investigating a variety of features. 1 fig.
- Research Organization:
- University of California
- DOE Contract Number:
- W-7405-ENG-48
- Assignee:
- Univ. of California, Oakland, CA (United States)
- Patent Number(s):
- US 5,444,241/A/
- Application Number:
- PAN: 8-130,486
- OSTI ID:
- 100990
- Country of Publication:
- United States
- Language:
- English
Similar Records
Emissivity corrected infrared method for imaging anomalous structural heat flows
Dual-band infrared thermography for quantitative nondestructive evaluation
Three-dimensional dynamic thermal imaging of structural flaws by dual-band infrared computed tomography
Patent
·
Sat Dec 31 23:00:00 EST 1994
·
OSTI ID:870041
Dual-band infrared thermography for quantitative nondestructive evaluation
Technical Report
·
Wed Mar 31 23:00:00 EST 1993
·
OSTI ID:10181259
Three-dimensional dynamic thermal imaging of structural flaws by dual-band infrared computed tomography
Conference
·
Wed Mar 31 23:00:00 EST 1993
·
OSTI ID:10180562