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Title: Characteristics of the MBE1 End-Station at PNC/XOR

Abstract

An end-station for in-situ characterization of thin films at the PNC/XOR undulator beamline, Sector 20 of the Advanced Photon Source, is detailed. The ability to study films in-situ on a beamline enables examination of surfaces and interfaces on freshly-prepared films, without the influence of a capping layer. The MBE1 molecular beam epitaxy system was designed with this in mind. Now in routine operation and available for General Users on a collaborative basis, the primary function of MBE1 is to undertake polarization-dependent XAFS studies on fresh or stored films, but it also has the capability to do X-ray Standing Wave and Reflectivity measurements. The characteristics of the MBE1 system - its ranges of motions and detector options - are described in detail, with example data illustrating its functionality.

Authors:
; ; ; ; ;  [1];  [2];  [2]
  1. (Aust. Synch.)
  2. (
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
Sponsoring Org.:
USDOE
OSTI Identifier:
1009006
Resource Type:
Conference
Resource Relation:
Conference: 13th International Conference on X-ray Absorption Fine Structure-XAFS13;9-14 July 2006;Stanford, California, USA
Country of Publication:
United States
Language:
ENGLISH
Subject:
43 PARTICLE ACCELERATORS; 36 MATERIALS SCIENCE; ABSORPTION; ADVANCED PHOTON SOURCE; MOLECULAR BEAM EPITAXY; REFLECTIVITY; STANDING WAVES; THIN FILMS; WIGGLER MAGNETS

Citation Formats

Gordon, R., Crozier, E.D., Jiang, D.-T., Shoults, J., Barg, B., Budnik, P.S., Simon, U. of Guelph), and Simon). Characteristics of the MBE1 End-Station at PNC/XOR. United States: N. p., 2007. Web.
Gordon, R., Crozier, E.D., Jiang, D.-T., Shoults, J., Barg, B., Budnik, P.S., Simon, U. of Guelph), & Simon). Characteristics of the MBE1 End-Station at PNC/XOR. United States.
Gordon, R., Crozier, E.D., Jiang, D.-T., Shoults, J., Barg, B., Budnik, P.S., Simon, U. of Guelph), and Simon). Thu . "Characteristics of the MBE1 End-Station at PNC/XOR". United States. doi:.
@article{osti_1009006,
title = {Characteristics of the MBE1 End-Station at PNC/XOR},
author = {Gordon, R. and Crozier, E.D. and Jiang, D.-T. and Shoults, J. and Barg, B. and Budnik, P.S. and Simon, U. of Guelph) and Simon)},
abstractNote = {An end-station for in-situ characterization of thin films at the PNC/XOR undulator beamline, Sector 20 of the Advanced Photon Source, is detailed. The ability to study films in-situ on a beamline enables examination of surfaces and interfaces on freshly-prepared films, without the influence of a capping layer. The MBE1 molecular beam epitaxy system was designed with this in mind. Now in routine operation and available for General Users on a collaborative basis, the primary function of MBE1 is to undertake polarization-dependent XAFS studies on fresh or stored films, but it also has the capability to do X-ray Standing Wave and Reflectivity measurements. The characteristics of the MBE1 system - its ranges of motions and detector options - are described in detail, with example data illustrating its functionality.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Thu Jan 18 00:00:00 EST 2007},
month = {Thu Jan 18 00:00:00 EST 2007}
}

Conference:
Other availability
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