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Spatially Resolved MicroDiffraction Analysis of the Plastic Deformation in the Shock Recovered Al Single Crystal

Conference ·
OSTI ID:1008997

A spatially resolved diffraction method with a sub micrometer-diameter beam and 3D differential aperture technique together with MD simulations, SEM and OIM analysis are applied to understand the arrangements of voids, geometrically necessary dislocations and strain gradient distribution in samples of Al (123) single crystal shocked to incipient spallation fracture. We describe how geometrically necessary dislocations and effective strain gradient alter white beam Laue patterns of the shocked materials. We show how to quantitatively determine the orientation and density of geometrically necessary dislocations in the shock recovered Al samples being initially oriented for single slip.

Research Organization:
Advanced Photon Source (APS), Argonne National Laboratory (ANL), Argonne, IL (US)
Sponsoring Organization:
USDOE
OSTI ID:
1008997
Country of Publication:
United States
Language:
ENGLISH