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High pressure study of Ti[subscript 4]AlN[subscript 3] to 55 GPa

Journal Article · · Appl. Phys. Lett.
DOI:https://doi.org/10.1063/1.1875750· OSTI ID:1008484
Using a synchrotron radiation source and a diamond anvil cell, we measured the pressure dependence of the lattice parameters of a polycrystalline Ti{sub 4}AlN{sub 3} sample up to a pressure of 55 GPa. No phase transformations were observed. As observed in Ti{sub 3}SiC{sub 2}, Ti{sub 3}Si{sub 0.5}Ge{sub 0.5}C{sub 2}, and Zr{sub 2}InC, the compressibility of Ti{sub 4}AlN{sub 3} along the c axis was larger than along the a axis which leads to a decrease in the c/a ratio with increasing pressure. The bulk modulus is 216 {+-} 2 GPa, with a pressure derivative of 3.84 {+-} 0.06.
Research Organization:
Advanced Photon Source (APS), Argonne National Laboratory (ANL), Argonne, IL (US)
Sponsoring Organization:
USDOE
OSTI ID:
1008484
Journal Information:
Appl. Phys. Lett., Journal Name: Appl. Phys. Lett. Journal Issue: 03, 2005 Vol. 86; ISSN APPLAB; ISSN 0003-6951
Country of Publication:
United States
Language:
ENGLISH

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