X-ray Diffuse Scattering near Bragg Relections for the Study of Clustered Defects in Crystalline Materials
- ORNL
The fundamental aspects of diffuse scattering from lattice defects within the coherent wave theory are reviewed, and the use of Huang and asymptotic diffuse scattering for the determination of the size, type, and internal structure of clustered defects is discussed. The scattering amplitude for diffuse scattering from lattice defects is presented within the single defect approximation, and the physical interpretation of the asymptotic diffuse scattering from dislocation loops and precipitates is discussed in terms of local Bragg scattering. The importance of using detailed and accurate displacement fields for calculating diffuse scattering cross sections for dislocation loops and coherent precipitates is emphasized, and examples of the measurement of size distributions for vacancy and interstitial loops and for coherent precipitates in Cu are revisited. In addition, the use of submicrometer-diameter X-ray microbeams to perform depth-resolved diffuse scattering measurements of vacancy and interstitial loop distributions in 10 MeV self-ion-implanted silicon single crystals is discussed.
- Research Organization:
- Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
- Sponsoring Organization:
- USDOE
- OSTI ID:
- 1008433
- Resource Relation:
- Related Information: Diffuse Scattering and the Fundamental Properties of Materials
- Country of Publication:
- United States
- Language:
- ENGLISH
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