Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

The Sandia MEMS Passive Shock Sensor : dormancy and aging.

Technical Report ·
DOI:https://doi.org/10.2172/1008111· OSTI ID:1008111

This report presents the results of an aging experiment that was established in FY09 and completed in FY10 for the Sandia MEMS Passive Shock Sensor. A total of 37 packages were aged at different temperatures and times, and were then tested after aging to determine functionality. Aging temperatures were selected at 100 C and 150 C, with times ranging from as short as 100 hours to as long as 1 year to simulate a predicted aging of up to 20 years. In all of the tests and controls, 100% of the devices continued to function normally.

Research Organization:
Sandia National Laboratories
Sponsoring Organization:
USDOE
DOE Contract Number:
AC04-94AL85000
OSTI ID:
1008111
Report Number(s):
SAND2010-6943
Country of Publication:
United States
Language:
English

Similar Records

The Sandia MEMS passive shock sensor : FY07 maturation activities.
Technical Report · Fri Aug 01 00:00:00 EDT 2008 · OSTI ID:940529

The Sandia MEMS Passive Shock Sensor : FY08 testing for functionality, model validation, and technology readiness.
Technical Report · Wed Oct 01 00:00:00 EDT 2008 · OSTI ID:943322

The Sandia MEMS passive shock sensor : FY08 design summary.
Technical Report · Sat Nov 01 00:00:00 EDT 2008 · OSTI ID:945193