Tomographic Imaging of Nanocrystals by Aberration-Corrected Scanning Transmission Electron Microscopy

van Benthem, Klaus; Peng, Yiping; Pennycook, Stephen J

Tomographic Imaging of Nanocrystals by Aberration-Corrected Scanning Transmission Electron Microscopy

Conference · Sat Jan 01 04:00:00 EST 2005

OSTI ID:1003395

van Benthem, Klaus ^[1]; Peng, Yiping ^[1]; Pennycook, Stephen J ^[1]

ORNL

No abstract prepared.

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Research Organization:: Oak Ridge National Laboratory (ORNL)

Sponsoring Organization:: ORNL LDRD Director's R&D; SC USDOE - Office of Science (SC)

DOE Contract Number:: AC05-00OR22725

OSTI ID:: 1003395

Country of Publication:: United States

Language:: English

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Related Subjects

47 OTHER INSTRUMENTATION
77 NANOSCIENCE AND NANOTECHNOLOGY
CRYSTALS
GEOMETRICAL ABERRATIONS
IMAGES
NANOSTRUCTURES
SCANNING ELECTRON MICROSCOPY
TOMOGRAPHY
TRANSMISSION ELECTRON MICROSCOPY

Tomographic Imaging of Nanocrystals by Aberration-Corrected Scanning Transmission Electron Microscopy

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