JcS in HTS Thick Films: Influence of Out-of-Plane Misorientation
- University of Kansas
- ORNL
Epitaxy of thick (typically a few microns) high-T{sub c} superconducting (HTS) films with on metal substrates is desired for coated conductor applications. Despite the 'typical' degradation of the critical current (J{sub c}) at large film thickness on single crystal oxide substrates, thick film coated conductors suffer more significant J{sub c} loss at comparable thickness. This motivated us to investigate effects of in-plane and out-of-plane misorientations on the thickness dependence (bottom up) and depth dependence (top down) of J{sub c}s. Bicrystals with pre-defined grain boundary angles are employed for controlling the in-plane misorientation, and miscut substrates with different miscut angles for controlling the out-of-plane misorientation. Several different types of HTS thick films including YBa{sub 2}Cu{sub 3}O{sub 7} (YBCO), Tl{sub 2}Ba{sub 2}CaCu{sub 2}O{sub 7+{delta}} (Tl-2212), HgBa{sub 2}CaCu{sub 2}O{sub 6+{delta}} (Hg-1212) will be investigated. By comparing materials with different anisotropy that may affect the thickness dependence of J{sub c}s, we intend to pinpoint the dominant mechanisms that are responsible for the degradation of the J{sub c} in HTS thick film coated conductors.
- Research Organization:
- Oak Ridge National Laboratory (ORNL)
- Sponsoring Organization:
- SC USDOE - Office of Science (SC)
- DOE Contract Number:
- AC05-00OR22725
- OSTI ID:
- 1003280
- Country of Publication:
- United States
- Language:
- English
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