Screen charge transfer by grounded tip on ferroelectric surfaces.
Journal Article
·
· Phys. Status Solidi RRL
We have investigated polarization reversal and charge transfer effects by a grounded tip on 50 nm thick ferroelectric thin films using piezoelectric force microscopy and Kelvin force microscopy. We observed the polarization reversal in the center of written domains, and also identified another mechanism, which is the transfer of screen charges toward the grounded tip. In order to overcome these phenomena, we successfully applied a modified read/write scheme featuring a bias voltage.
- Research Organization:
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC); Samsung Electronics
- DOE Contract Number:
- DE-AC02-06CH11357
- OSTI ID:
- 1002233
- Report Number(s):
- ANL/MSD/JA-68850; TRN: US201102%%669
- Journal Information:
- Phys. Status Solidi RRL, Vol. 2, Issue 2 ; Mar. 2008
- Country of Publication:
- United States
- Language:
- ENGLISH
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