Performance of a four-element Si drift detector for X-ray absorption fine-structure spectroscopy: resolution, maximum count rate, and dead-time correction with incorporation into the ATHENA data analysis software

Journal Article · Tue Mar 09 04:00:00 EST 2010 · Journal of Synchrotron Radiation

DOI:https://doi.org/10.1107/S0909049510009064· OSTI ID:1000734

Woicik, J C; Newburgh, W; Ravel, B; Fischer, D A

The performance of a four-element Si drift detector for energy-dispersive fluorescence-yield X-ray absorption fine-structure measurements is reported, operating at the National Institute of Standards and Technology beamline X23A2 at the National Synchrotron Light Source. The detector can acquire X-ray absorption fine-structure spectra with a throughput exceeding 4 x 10{sup 5} counts per second per detector element (>1.6 x 10{sup 6} total counts per second summed over all four channels). At this count rate the resolution at 6 keV is approximately 220 eV, which adequately resolves the Mn K{sub {alpha}} and K{sup {beta}} fluorescence lines. Accurate dead-time correction is demonstrated, and it has been incorporated into the ATHENA data analysis program. To maintain counting efficiency and high signal to background, it is suggested that the incoming count rate should not exceed {approx}70% of the maximum throughput.

• Research Organization: BROOKHAVEN NATIONAL LABORATORY (BNL)
• Sponsoring Organization: DOE - Office Of Science
• DOE Contract Number: AC02-98CH10886
• OSTI ID: 1000734
• Report Number(s): BNL--94037-2010-JA; KC0401030
• Journal Information: Journal of Synchrotron Radiation, Journal Name: Journal of Synchrotron Radiation Journal Issue: 3 Vol. 17; ISSN 0909-0495; ISSN JSYRES
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
43 PARTICLE ACCELERATORS
ABSORPTION
DATA ANALYSIS
DEAD TIME
EFFICIENCY
FINE STRUCTURE
FLUORESCENCE
NSLS
PERFORMANCE
RESOLUTION
SPECTRA
SPECTROSCOPY