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Title: Bias in calculated k{sub eff} from subcritical measurements by the {sup 252}Cf-source-driven noise analysis method

Technical Report ·
DOI:https://doi.org/10.2172/95236· OSTI ID:95236

The development of MCNP-DSP, which allows direct calculation of the measured time and frequency analysis parameters from subcritical measurements using the {sup 252}Cf-source-driven noise analysis method, permits the validation of calculational methods for criticality safety with in-plant subcritical measurements. In addition, a method of obtaining the bias in the calculations, which is essential to the criticality safety specialist, is illustrated using the results of measurements with 17.771-cm-diam, enriched (93.15), unreflected, and unmoderated uranium metal cylinders. For these uranium metal cylinders the bias obtained using MCNP-DSP and ENDF/B-V cross-section data increased with subcriticality. For a critical experiment [height (h) = 12.629 cm], it was {minus}0.0061 {+-} 0.0003. For a 10.16-cm-high cylinder (k {approx} 0.93), it was 0.0060 {+-} 0.0016, and for a subcritical cylinder (h = 8.13 cm, k {approx} 0.85), the bias was {minus}0.0137 {+-} 0.0037, more than a factor of 2 larger in magnitude. This method allows the nuclear criticality safety specialist to establish the bias in calculational methods for criticality safety from in-plant subcritical measurements by the {sup 252}Cf-source-driven noise analysis method.

Research Organization:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Organization:
USDOE, Washington, DC (United States)
DOE Contract Number:
AC05-84OR21400
OSTI ID:
95236
Report Number(s):
CONF-9509100-6; ON: DE95014587; TRN: 95:018503
Resource Relation:
Conference: 5. international conference on nuclear criticality safety, Albuquerque, NM (United States), 17-22 Sep 1995; Other Information: PBD: [1995]
Country of Publication:
United States
Language:
English