The Effect of Excess Carbon on the Crystallographic, Microstructural, and Mechanical Properties of CVD Silicon Carbide Fibers

Conference · Tue Dec 05 00:00:00 EST 2006

DOI:https://doi.org/10.1557/PROC-0982-KK07-16· OSTI ID:900880

Marzik, J V; Croft, W J; Staples, R J; MoberlyChan, W J

Silicon carbide (SiC) fibers made by chemical vapor deposition (CVD) are of interest for organic, ceramic, and metal matrix composite materials due their high strength, high elastic modulus, and retention of mechanical properties at elevated processing and operating temperatures. The properties of SCS-6{trademark} silicon carbide fibers, which are made by a commercial process and consist largely of stoichiometric SiC, were compared with an experimental carbon-rich CVD SiC fiber, to which excess carbon was added during the CVD process. The concentration, homogeneity, and distribution of carbon were measured using energy dispersive x-ray spectroscopy (SEM/EDS). The effect of excess carbon on the tensile strength, elastic modulus, and the crystallographic and microstructural properties of CVD silicon carbide fibers was investigated using tensile testing, x-ray diffraction, scanning electron microscopy (SEM), and transmission electron microscopy (TEM).

• Research Organization: Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
• Sponsoring Organization: USDOE
• DOE Contract Number: W-7405-ENG-48
• OSTI ID: 900880
• Report Number(s): UCRL-PROC-226742; TRN: US200711%%625
• Resource Relation: Journal Volume: 982; Conference: Presented at: Materials Research Society, Boston, MA, United States, Nov 26 - Dec 01, 2006
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
42 ENGINEERING
37 INORGANIC
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
CARBON
CHEMICAL VAPOR DEPOSITION
COMPOSITE MATERIALS
DISTRIBUTION
FIBERS
MECHANICAL PROPERTIES
PROCESSING
RETENTION
SCANNING ELECTRON MICROSCOPY
SILICON CARBIDES
TENSILE PROPERTIES
TESTING
TRANSMISSION ELECTRON MICROSCOPY
X-RAY DIFFRACTION
X-RAY SPECTROSCOPY