Some tests of avalanche photodiodes produced by Advanced Photonix, Inc.
- Fermi National Accelerator Lab., Batavia, IL (United States)
- Minnesota State Univ., Minneapolis, MN (United States)
The goal of the measurements presented here is to check some parameters of the high gain avalanche photodiodes (APD`s) produced by Advanced Photonix, Inc. Samples with 16 mm and 5 mm diameter sensitive areas were tested. The tests were performed at FNAL. The new photomultiplier testing facility were used for gain measurements, linearity, and nonuniformity studies. The setup consists of laser with shifted wavelength of 440 nm, 10 Hz repetition rate and a pulse duration of 15 nsec. The laser light was transported to the APD by 1 mm diameter clear fiber. An amount of laser light was adjusted by rotating wheels of fixed light attenuation. The dynamic range of the APD, an amplifier (AMP) and an ADC was about 1000. To get the nonuniformity data the APD was mounted on a moveable stage under management and control of computer. The positioning of the fiber along sensitive surface of the APD was better than 100 microns.
- Research Organization:
- Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- AC02-76CH03000
- OSTI ID:
- 88548
- Report Number(s):
- FNAL-TM-1943; ON: DE95016647; TRN: 95:017956
- Resource Relation:
- Other Information: PBD: Aug 1995
- Country of Publication:
- United States
- Language:
- English
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