Uncooled infrared photon detector and multicolor infrared detection using microoptomechanical sensors

Patent · Fri Jan 01 00:00:00 EST 1999

OSTI ID:872632

Datskos, Panagiotis G ^[1]; Rajic, Solobodan ^[1]; Datskou, Irene C ^[1]

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1. Knoxville, TN

Systems and methods for infrared detection are described. An optomechanical photon detector includes a semiconductor material and is based on measurement of a photoinduced lattice strain. A multicolor infrared sensor includes a stack of frequency specific optomechanical detectors. The stack can include one, or more, of the optomechanical photon detectors that function based on the measurement of photoinduced lattice strain. The systems and methods provide advantages in that rapid, sensitive multicolor infrared imaging can be performed without the need for a cooling subsystem.

• Research Organization: Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA (United States)
• DOE Contract Number: AC04-76
• Assignee: Lockheed Martin Energy Research Corporation (Oak Ridge, TN)
• Patent Number(s): US 5977544
• OSTI ID: 872632
• Country of Publication: United States
• Language: English

Related Subjects

uncooled
infrared
photon
detector
multicolor
detection
microoptomechanical
sensors
systems
methods
described
optomechanical
semiconductor
material
based
measurement
photoinduced
lattice
strain
sensor
stack
frequency
specific
detectors
function
provide
advantages
rapid
sensitive
imaging
performed
cooling
subsystem
semiconductor material
provide advantages
methods provide
photon detector
lattice strain
infrared detection
infrared imaging
mechanical sensors
mechanical sensor
/250/73/356/