Method and apparatus for calibrating a particle emissions monitor

Patent · Tue Jul 07 00:00:00 EDT 1998

OSTI ID:871694

Flower, William L ^[1]; Renzi, Ronald F ^[2]

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1. Livermore, CA
2. Tracy, CA

The instant invention discloses method and apparatus for calibrating particulate emissions monitors, in particular, and sampling probes, in general, without removing the instrument from the system being monitored. A source of one or more specific metals in aerosol (either solid or liquid) or vapor form is housed in the instrument. The calibration operation is initiated by moving a focusing lens, used to focus a light beam onto an analysis location and collect the output light response, from an operating position to a calibration position such that the focal point of the focusing lens is now within a calibration stream issuing from a calibration source. The output light response from the calibration stream can be compared to that derived from an analysis location in the operating position to more accurately monitor emissions within the emissions flow stream.

• Research Organization: Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA (United States)
• DOE Contract Number: AC04-94AL85000
• Assignee: Sandia Corporation (Livermore, CA)
• Patent Number(s): US 5777734
• Application Number: 08/585,341
• OSTI ID: 871694
• Country of Publication: United States
• Language: English

Related Subjects

method
apparatus
calibrating
particle
emissions
monitor
instant
discloses
particulate
monitors
particular
sampling
probes
removing
instrument
monitored
source
specific
metals
aerosol
solid
liquid
vapor
form
housed
calibration
operation
initiated
moving
focusing
lens
focus
light
beam
analysis
location
collect
output
response
operating
position
focal
stream
issuing
compared
derived
accurately
flow
output light
particulate emissions
focusing lens
light beam
flow stream
sampling probe
operating position
vapor form
analysis location
particle emissions
particulate emission
specific metal
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