Measurements and characterization - Electro-optical characterization
Book
·
OSTI ID:754750
This brochure presents the capabilities that the Measurements and Characterization Division has in Electro-Optical Characterization, in which a variety of spectroscopy, ellipsometry, and capacitance techniques are used to probe the fundamental electrical and optical properties of solid-state materials.
- Research Organization:
- National Renewable Energy Lab. (NREL), Golden, CO (United States)
- Sponsoring Organization:
- US Department of Energy (US)
- DOE Contract Number:
- AC36-99GO10337
- OSTI ID:
- 754750
- Report Number(s):
- NREL/BR-530-22214; DOE/GO-10099-802; TRN: AH200015%%3
- Resource Relation:
- Other Information: PBD: 16 Mar 2000
- Country of Publication:
- United States
- Language:
- English
Similar Records
Measurements and characterization - Surface analysis
Measurements and characterization - Analytical microscopy
Measurements and characterization - Device performance
Book
·
Thu Mar 16 00:00:00 EST 2000
·
OSTI ID:754750
Measurements and characterization - Analytical microscopy
Book
·
Thu Mar 16 00:00:00 EST 2000
·
OSTI ID:754750
Measurements and characterization - Device performance
Book
·
Thu Mar 16 00:00:00 EST 2000
·
OSTI ID:754750
Related Subjects
14 SOLAR ENERGY
36 MATERIALS SCIENCE
PHOTOVOLTAIC CELLS
NATIONAL RENEWABLE ENERGY LABORATORY
MATERIALS
ELECTRICAL PROPERTIES
OPTICAL PROPERTIES
SPECTROSCOPY
ELLIPSOMETRY
CAPACITANCE
PHOTOVOLTAICS
MATERIALS
ANALYSIS
CHARACTERIZATION
ELECTRO-OPTICAL
MINORITY CARRIER
MINORITY-CARRIER LIFETIMES
ELLIPSOMETRY
LASERS
FEMTOSECOND
SPECTROSCOPY
CAPACITANCE TECHNIQUES
DEEP-LEVEL TRANSIENCE
FOURIER TRANSFORM INFRARED
RAMAN SPECTROSCOPY
PHOTOLUMINESCENCE
SCANNING DEFECT MAPPING
PUMP PROBE
UP-CONVERSION
SINGLE-PHOTON COUTING
ULTRA-HIGH FREQUENCY PHOTOCONDUCTIVE DECAY
36 MATERIALS SCIENCE
PHOTOVOLTAIC CELLS
NATIONAL RENEWABLE ENERGY LABORATORY
MATERIALS
ELECTRICAL PROPERTIES
OPTICAL PROPERTIES
SPECTROSCOPY
ELLIPSOMETRY
CAPACITANCE
PHOTOVOLTAICS
MATERIALS
ANALYSIS
CHARACTERIZATION
ELECTRO-OPTICAL
MINORITY CARRIER
MINORITY-CARRIER LIFETIMES
ELLIPSOMETRY
LASERS
FEMTOSECOND
SPECTROSCOPY
CAPACITANCE TECHNIQUES
DEEP-LEVEL TRANSIENCE
FOURIER TRANSFORM INFRARED
RAMAN SPECTROSCOPY
PHOTOLUMINESCENCE
SCANNING DEFECT MAPPING
PUMP PROBE
UP-CONVERSION
SINGLE-PHOTON COUTING
ULTRA-HIGH FREQUENCY PHOTOCONDUCTIVE DECAY