Synchrotron radiation induced x-ray micro analysis: A realistic alternative for electron- and ion beam microscopy
- Universitaire Instelling Antwerpen, Antwerp (Belgium). Dept. of Chemistry
- Brookhaven National Lab., Upton, NY (United States)
Synchrotron Radiation induced X-ray micro Fluorescence analysis ([mu]-SRXRF) is compared with more conventional microanalytical techniques such as Secondary Ion Microscopy (SIMS) and Electron Probe X-ray Microanalysis (EPXMA) for two typical microanalytical applications. SRXRF and EPXMA are employed for the analysis of individual particles, showing the complementary character of both techniques. By means of element mapping of trace constituents in a heterogeneous feldspar, the strong and weak points of SRXRF in comparison to EPXMA and SIMS are illustrated. The most striking difference between SRXRF and the other two microanalytical methods is the ability of SRXRF to probe deep into the investigated Material, whereas SIMS and EPXMA only investigate the upper surface of the material. The possibilities of SRXRF at third generation synchrotron rings is also briefly discussed.
- Research Organization:
- Brookhaven National Lab., Upton, NY (United States)
- Sponsoring Organization:
- USDOE; National Science Foundation (NSF); BENSF; USDOE, Washington, DC (United States); National Science Foundation, Washington, DC (United States); Belgian National Science Fund (Belgium)
- DOE Contract Number:
- AC02-76CH00016
- OSTI ID:
- 6966613
- Report Number(s):
- BNL-48003; CONF-9208150-1; ON: DE93001975; CNN: Nr. 2009291N; EAR 89-14669
- Resource Relation:
- Conference: 27. annual meeting of the Microbeam Analysis Society (MAS) (United States) and the 19th annual meeting of the Microscopical Society of Canada (MSC), Boston, MA (United States), Aug 1992; Other Information: To be published in The Microbeam Analysis Journal
- Country of Publication:
- United States
- Language:
- English
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SUPERCONDUCTIVITY AND SUPERFLUIDITY
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ELECTRON MICROPROBE ANALYSIS
COMPARATIVE EVALUATIONS
ION MICROSCOPY
X-RAY FLUORESCENCE ANALYSIS
AEROSOLS
ALUMINIUM
ELEMENTS
FLUORESCENCE SPECTROSCOPY
IRON
MULTI-ELEMENT ANALYSIS
POTASSIUM
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SILICON
SODIUM
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ALKALI METALS
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EVALUATION
METALS
MICROANALYSIS
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NONDESTRUCTIVE ANALYSIS
RADIATIONS
SEMIMETALS
SOLS
SPECTROSCOPY
TRANSITION ELEMENTS
X-RAY EMISSION ANALYSIS
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