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Title: Bragg reflection transmission filters for variable resolution monochromators

Conference ·
OSTI ID:5675260
 [1]
  1. Brookhaven National Lab., Upton, NY (USA)

There are various methods for improving the angular and spectral resolution of monochromator and analyzer systems. The novel system described here, though limited to higher x-ray energies (>20keV), is based on a dynamical effect occurring on the transmitted beam with a thin perfect crystal plate set in the Bragg reflection case. In the case of Bragg reflection from a perfect crystal, the incident beam is rapidly attenuated as it penetrates the crystal in the range of reflection. This extinction length is of the order of microns. The attenuation length, which determines the amount of normal transmission through the plate is generally much longer. Thus, in the range of the Bragg reflection the attenuation of the transmitted beam can change by several orders of magnitude with a small change in energy or angle. This thin crystal plate cuts a notch in the transmitted beam with a width equal to its Darwin width, thus acting as a transmission filter. When used in a non-dispersive mode with other monochromator crystals, the filter when set at the Bragg angle will reflect the entire Darwin width of the incident beam and transmit the wings of the incident beam distribution. When the element is offset in angle by some fraction of the Darwin width, the filter becomes useful in adjusting the angular width of the transmitted beam and removing a wing. Used in pairs with a symmetric offset, the filters can be used to continuously adjust the intrinsic angular divergence of the beam with good wing reduction. Instances where such filters may be useful are in improving the angular resolution of a small angle scattering camera. These filters may be added to a Bonse-Hart camera with one pair on the incident beam to reduce the intrinsic beam divergence and a second pair on the analyzer arm to improve the analyzer resolution. 2 refs., 3 Figs.

Research Organization:
Brookhaven National Lab., Upton, NY (USA)
Sponsoring Organization:
DOE/ER
DOE Contract Number:
AC02-76CH00016
OSTI ID:
5675260
Report Number(s):
BNL-42943; CONF-890802-12; ON: DE90001547; TRN: 89-029401
Resource Relation:
Conference: 7. synchrotron radiation instrumentation (SRI) national conference, Berkeley, CA (USA), 6-10 Aug 1989
Country of Publication:
United States
Language:
English