Nondestructive evaluation techniques for high-temperature ceramic components. Eighth quarterly report, July-September 1979
Progress in research on nondestructive techniques for detecting defects in high-temperature structural ceramics is reported. These techniques include dye-enhanced radiography, acoustic microscopy, conventional ultrasonic testing, acoustic-emission detection, acoustic impact testing, holographic interferometry, infrared scanning, internal friction measurements and overload proof testing. The effect of varying microstructure on flaw detectability was demonstrated by comparing ultrasonic signal amplitudes from notches in siliconized and sintered SiC tubes. Signal amplitudes were approx. 4 dB higher in the sintered material. Knoop dents with depths as small as 25 ..mu..m, not detectable at conventional operating frequency (10 MHz), were clearly resolved by use of a 75-MHz transducer. The velocity of sound was measured as a function of the volume fraction of silicon in Carborundum KT samples. The results suggest that measurement of the velocity of sound may be adequate for indicating silicon content. Initial data have been presented on flaw detection in SiC tubing with the bore-side ultrasonic probe and acoustic microscope stage. Preliminary results were encouraging. A novel dynamic holography technique was demonstrated. A 100 x 50-mm-deep Knoop indent in a SiC bar could clearly be seen by this technique, which is a significant improvement over previous optical methods. (LCL)
- Research Organization:
- Argonne National Lab. (ANL), Argonne, IL (United States)
- DOE Contract Number:
- W-31-109-ENG-38
- OSTI ID:
- 5541200
- Report Number(s):
- ANL/MSD-79-7
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
36 MATERIALS SCIENCE
NONDESTRUCTIVE TESTING
RESEARCH PROGRAMS
SILICON CARBIDES
DEFECTS
TUBES
ACOUSTIC TESTING
HEAT EXCHANGERS
INDUSTRIAL RADIOGRAPHY
INFRARED THERMOGRAPHY
INTERFEROMETRY
ULTRASONIC TESTING
VERY HIGH TEMPERATURE
CARBIDES
CARBON COMPOUNDS
MATERIALS TESTING
SILICON COMPOUNDS
TESTING
THERMAL TESTING
THERMOGRAPHY
420500* - Engineering- Materials Testing
360200 - Ceramics
Cermets
& Refractories