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Title: Electrical Contact Performance Degradation in Electromechanical Components

Conference ·
OSTI ID:5041

Detailed materials evaluations have been performed for MC2969 Intent Stronglink switch monitor circuit parts returned from the field out of retired weapon systems. Evaluations of local contact resistance, surface chemical composition and surface roughness and wear have been determined as a function of component level contact loop resistance testing position. Several degradation mechanisms have been identified and correlated with the component level measurements. Operational degradation produces surface smoothing and wear with each actuation of the monitor circuit, while aging degradation is observed in the segregation of contaminant species and alloy constituent elements to the surface in the stressed wear regions.

Research Organization:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States); Sandia National Lab. (SNL-CA), Livermore, CA (United States)
Sponsoring Organization:
US Department of Energy (US)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
5041
Report Number(s):
SAND99-0698C; TRN: AH200115%%18
Resource Relation:
Conference: 22nd Aging, Compatibility and Stockpile Stewardship Conference, Oak Ridge, TN (US), 04/27/1999--04/29/1999; Other Information: PBD: 23 Mar 1999
Country of Publication:
United States
Language:
English