Optical Design of $$\mathrm{DEI/ABI}$$ System at the $$\mathrm{HEX}$$ Beamline at the $$\mathrm{NSLS-II}$$
- Brookhaven National Laboratory (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II)
- Qatar University, Doha (Qatar)
- FMB-Oxford (United Kingdom)
- Half Hollow Hills High School East, Dix Hills, NY (United States)
Diffraction Enhanced Imaging (DEI) or Analyzer Based Imaging (ABI) uses a perfect crystal monochromator and matching analyzer to achieve sensitivity to x-ray refraction and ultra small-angle scattering on the order of 0.01 micro-radians. As such, a thermal bump caused by heat-load in the order of 1 W is detrimental. The heat load at the HEX (High Energy Engineering X-ray) super-conducting wiggler (SCW) beamline, under construction at the NSLS-II, is on the order of 1 kW. How to reconcile the three orders of magnitude difference between the HEX source power and the DEI/ABI requirements? The solution involves using a double-crystal bent-Laue monochromator as pre-monochromator to prepare a beam with a large divergence and bandwidth that is matched to a flat crystal post-monochromator. We show through phase-space (x-ray energy vs. angle as viewed by a flat crystal) analysis and Dumond diagrams that there is indeed a unique bending radius that matches the double-crystal bent-Laue monochromator in phase space to the flat Bragg crystal. The matched system has a desirable feature that the phase space of the bent crystal’s output beam is much larger than that of the flat crystal, making the combined system stable. Based on these considerations, here we present our optical design for performing DEI/ABI at the HEX beamline
- Research Organization:
- Brookhaven National Lab. (BNL), Upton, NY (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), Basic Energy Sciences (BES); New York State Energy Research and Development Authority (NYSERDA)
- Grant/Contract Number:
- SC0012704
- OSTI ID:
- 1924207
- Report Number(s):
- BNL-224001-2023-JAAM
- Journal Information:
- Synchrotron Radiation News, Vol. 34, Issue 6; ISSN 0894-0886
- Publisher:
- Taylor & FrancisCopyright Statement
- Country of Publication:
- United States
- Language:
- English
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