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Title: Suppression of the vacuum space-charge effect in fs-photoemission by a retarding electrostatic front lens

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/5.0046567· OSTI ID:1852081
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  1. Johannes Gutenberg Univ., Mainz (Germany). Institut für Physik
  2. Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
  3. Univ. of Hamburg (Germany). Institut für Experimentalphysik
  4. Stony Brook Univ., NY (United States). Depts. of Chemistry and Physics
  5. Fritz-Haber-Institut der Max-Planck-Gesellschaft, Berlin (Germany)
  6. Imperial College, London (United Kingdom). Dept. of Bioengineering
  7. Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany). Ruprecht Haensel Lab.
  8. Uppsala Univ. (Sweden). Dept. of Physics and Astronomy
  9. Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany). Ruprecht Haensel Lab.; Christian-Albrechts-Universität zu Kiel, Kiel (Germany). Institut für Experimentelle und Angewandte Physik

The performance of time-resolved photoemission experiments at fs-pulsed photon sources is ultimately limited by the e–e Coulomb interaction, downgrading energy and momentum resolution. Here, we present an approach to effectively suppress space-charge artifacts in momentum microscopes and photoemission microscopes. A retarding electrostatic field generated by a special objective lens repels slow electrons, retaining the k-image of the fast photoelectrons. The suppression of space-charge effects scales with the ratio of the photoelectron velocities of fast and slow electrons. Fields in the range from -20 to 01100 V/mm for Ekin = 100 eV to 4 keV direct secondaries and pump-induced slow electrons back to the sample surface. Ray tracing simulations reveal that this happens within the first 40 to 3 μm above the sample surface for Ekin = 100 eV to 4 keV. An optimized front-lens design allows switching between the conventional accelerating and the new retarding mode. Time-resolved experiments at Ekin = 107 eV using fs extreme ultraviolet probe pulses from the free-electron laser FLASH reveal that the width of the Fermi edge increases by just 30 meV at an incident pump fluence of 22 mJ/cm2 (retarding field -21 V/mm). For an accelerating field of +2 kV/mm and a pump fluence of only 5 mJ/cm2 , it increases by 0.5 eV (pump wavelength 1030 nm). At the given conditions, the suppression mode permits increasing the slow-electron yield by three to four orders of magnitude. The feasibility of the method at high energies is demonstrated without a pump beam at Ekin = 3830 eV using hard x rays from the storage ring PETRA III. The approach opens up a previously inaccessible regime of pump fluences for photoemission experiments.

Research Organization:
State Univ. of New York (SUNY), Albany, NY (United States)
Sponsoring Organization:
USDOE Office of Science (SC)
Grant/Contract Number:
SC0016017
OSTI ID:
1852081
Journal Information:
Review of Scientific Instruments, Vol. 92, Issue 5; ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)Copyright Statement
Country of Publication:
United States
Language:
English

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