In situ transmission electron microscopy with dual ion beam irradiation and implantation

Li, Meimei; Chen, Wei-Ying; Baldo, Peter M.

doi:10.1016/j.matchar.2021.110905

Title: In situ transmission electron microscopy with dual ion beam irradiation and implantation

Journal Article · Thu Jan 14 00:00:00 EST 2021 · Materials Characterization

DOI:https://doi.org/10.1016/j.matchar.2021.110905· OSTI ID:1780693

Li, Meimei ^[1]; Chen, Wei-Ying ^[1]; Baldo, Peter M. ^[1]

Argonne National Lab. (ANL), Lemont, IL (United States)

To study the helium effects and their interactions with displacement damage in irradiated materials, an in situ dual-ion beam irradiation capability with transmission electron microscopy was recently established at the IVEM-Tandem Facility at Argonne National Laboratory. Pure nickel was irradiated in situ individually with 1 MeV Kr ions for displacement damage study, 16 keV He ions for helium implantation, and simultaneously with 1 MeV Kr ions and 16 keV He ions at the rate of 1 at.% He/dpa to study the interaction of helium and displacement damage at 500 degrees C. Helium bubbles were formed and segregated within dislocation loops during the He implantation experiment and no bubbles were observed outside the loops. The loop size increased with increasing helium concentration. In contrast, helium bubbles were formed uniformly in the matrix when nickel was irradiated simultaneously with 1 MeV Kr ions and 16 keV He ions. Overall, it is suggested that the uniformly-distributed defect clusters formed under 1 MeV Kr ion irradiation serve as trapping sites of helium atoms resulting in homogeneous nucleation of helium bubbles under the dualion beam irradiation in nickel.

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Research Organization:: Argonne National Lab. (ANL), Argonne, IL (United States)

Sponsoring Organization:: USDOE Office of Nuclear Energy (NE)

Grant/Contract Number:: AC02-06CH11357

OSTI ID:: 1780693

Alternate ID(s):: OSTI ID: 1778604

Journal Information:: Materials Characterization, Vol. 173; ISSN 1044-5803

Publisher:: ElsevierCopyright Statement

Country of Publication:: United States

Language:: English

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