Efficient and Flexible Sensitivity Matrix Computation for Adaptive Electrical Capacitance Volume Tomography

Acero, Daniel Ospina; Chowdhury, Shah M.; Marashdeh, Qussai M.; Teixeira, Fernando L.

doi:10.1109/tim.2020.3047482

Title: Efficient and Flexible Sensitivity Matrix Computation for Adaptive Electrical Capacitance Volume Tomography

Journal Article · Fri Dec 25 00:00:00 EST 2020 · IEEE Transactions on Instrumentation and Measurement

DOI:https://doi.org/10.1109/tim.2020.3047482· OSTI ID:1756408

Acero, Daniel Ospina ^[1]; Chowdhury, Shah M. ^[1]; Marashdeh, Qussai M. ^[2]; Teixeira, Fernando L. ^[1]

The Ohio State Univ., Columbus, OH (United States)
Tech4Imaging LLC, Columbus, OH (United States)

Electrical capacitance tomography is a widely used sensor modality for flow imaging in many industrial settings. Adaptive Electrical Capacitance Volume Tomography (AECVT) extends the capabilities of traditional ECT by enabling direct volumetric imaging and an improved resolution. Construction of the sensitivity matrix is a necessary step to obtain flow images. This step requires computation of the electric field inside the sensing domain, which is done via a typical field solver such as the finite element method. In this work, we present an efficient and flexible method to construct the sensitivity matrix for Adaptive Electrical Capacitance Volume Tomography (AECVT) based on individual electrode segment excitations and their judicious combination to form desired matrix elements. We illustrate how the proposed method yields the same sensitivity matrix as the traditional method but at a much lower computational cost. Once all segment contributions are obtained, we also indicate how the proposed method, unlike the traditional approach, can generate the sensitivity matrix on demand for an arbitrary combination of synthetic electrodes and obviating the need for any additional field computations. Finally, we present image reconstruction results for two different experimental scenarios where the mutual capacitance data and the corresponding sensitivity vectors are obtained through the proposed measurement combination scheme.

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Research Organization:: Tech4Imaging LLC, Columbus, OH (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Engineering & Technology. Office of Small Business Innovation Research (SBIR) and Small Business Technology Transfer (STTR) Programs

Grant/Contract Number:: SC0018758

OSTI ID:: 1756408

Journal Information:: IEEE Transactions on Instrumentation and Measurement, Vol. 70; ISSN 0018-9456

Publisher:: IEEECopyright Statement

Country of Publication:: United States

Language:: English

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