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Title: From first-principles defect chemistry to device damage models of radiation effects in III-V semiconductors.

Conference ·
OSTI ID:1593578

Abstract not provided.

Research Organization:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
1593578
Report Number(s):
SAND2018-11832C; 669257
Resource Relation:
Conference: Proposed for presentation at the The 9th International Conference on Multiscale Materials Modeling (MMM-2018) held October 28 - November 2, 2018 in Osaka, Osaka Prefecture, Japan.
Country of Publication:
United States
Language:
English

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