Surface-Enhanced Raman Scattering (SERS) Studies of Disc-on-Pillar (DOP) Arrays: Contrasting Enhancement Factor with Analytical Performance

Velez, Raymond A.; Lavrik, Nickolay V.; Kravchenko, Ivan I.; Sepaniak, Michael J.; Jesus, Marco A.  De

doi:10.1177/0003702819846503

Title: Surface-Enhanced Raman Scattering (SERS) Studies of Disc-on-Pillar (DOP) Arrays: Contrasting Enhancement Factor with Analytical Performance

Journal Article · Mon May 20 00:00:00 EDT 2019 · Applied Spectroscopy

DOI:https://doi.org/10.1177/0003702819846503· OSTI ID:1564208

^[1]; Lavrik, Nickolay V. ^[2]; Kravchenko, Ivan I. ^[2]; Sepaniak, Michael J. ^[3]; Jesus, Marco A. De ^[1]

Univ. of Puerto Rico, Mayaguez (Puerto Rico)
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Univ. of Tennessee, Knoxville, TN (United States)

The use of nanomachining methods capable of reproducible construction of nano-arrayed devices have revolutionized the field of plasmonic sensing by the introduction of a diversity of rationally engineered designs. Significant strides have been made to fabricate plasmonic platforms with tailored interparticle gaps to improve their performance for surface-enhanced Raman scattering (SERS) applications. Over time, a dichotomy has emerged in the implementation of SERS for analytical applications, the construction of substrates, optimization of interparticle spacing as a means to optimize electromagnetic field enhancement at the localized surface plasmon level, and the substrate sensitivity over extended areas to achieve quantitative performance. Here, we assessed the enhancement factor of plasmonic Ag/SiO₂/Si disc-on-pillar (DOP) arrays of variable pitch with its analytical performance for quantitative applications. Experimental data were compared with those from finite-difference time-domain (FDTD) simulations used in the optimization of the array dimensions. A self-assembled monolayer (SAM) of benzenethiol rendered highly reproducible signals (RSD ~4–10%) and SERS substrate enhancement factor (SSEF) values in the orders of 10⁶–10⁸ for all pitches. Furthermore, spectra corresponding to rhodamine 6G (R6G) and 4-aminobenzoic acid demonstrated the advantages of using the more densely packed DOP arrays with a 160 nm pitch (gap= 40 nm) for quantitation in spite of the strongest SSEF was attained for a pitch of 520 nm corresponding to a 400 nm gap.

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Research Organization:: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: AC05-00OR22725

OSTI ID:: 1564208

Journal Information:: Applied Spectroscopy, Vol. 73, Issue 6; ISSN 0003-7028

Publisher:: Society for Applied SpectroscopyCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 2 works

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36 MATERIALS SCIENCE
Surface-enhanced Raman spectroscopy
SERS
nanofabrication
finite-difference time-domain
FDTD
calibration sensitivity
SERS substrate enhancement factor
disc-on-pillar

Supplemental material for Surface-Enhanced Raman Scattering (SERS) Studies of Disc-on-Pillar (DOP) Arrays: Contrasting Enhancement Factor with Analytical Performance Velez, Raymond A.; Lavrik, Nickolay V.; Kravchenko, Ivan I. https://doi.org/10.25384/sage.8185886 The current record is supplemented by this text	text	January 2019
Supplemental material for Surface-Enhanced Raman Scattering (SERS) Studies of Disc-on-Pillar (DOP) Arrays: Contrasting Enhancement Factor with Analytical Performance Velez, Raymond A.; Lavrik, Nickolay V.; Kravchenko, Ivan I. https://doi.org/10.25384/sage.8185886.v1 The current record is supplemented by this text	text	January 2019
Surface-Enhanced Raman Scattering (SERS) Studies of Disc-on-Pillar (DOP) Arrays: Contrasting Enhancement Factor with Analytical Performance Velez, Raymond A.; Lavrik, Nickolay V.; Kravchenko, Ivan I. https://doi.org/10.25384/sage.c.4518350 The current record is supplemented by this collection	collection	January 2019
Surface-Enhanced Raman Scattering (SERS) Studies of Disc-on-Pillar (DOP) Arrays: Contrasting Enhancement Factor with Analytical Performance Velez, Raymond A.; Lavrik, Nickolay V.; Kravchenko, Ivan I. https://doi.org/10.25384/sage.c.4518350.v1 The current record is supplemented by this collection	collection	January 2019

Title: Surface-Enhanced Raman Scattering (SERS) Studies of Disc-on-Pillar (DOP) Arrays: Contrasting Enhancement Factor with Analytical Performance

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