A novel electron mirror pulse compressor

Mankos, M.; Shadman, K.; Siwick, B. J.

doi:10.1016/j.ultramic.2017.05.004

Title: A novel electron mirror pulse compressor

Journal Article · Wed May 10 00:00:00 EDT 2017 · Ultramicroscopy

DOI:https://doi.org/10.1016/j.ultramic.2017.05.004· OSTI ID:1538884

Mankos, M. ^[1]; Shadman, K. ^[1]; Siwick, B. J. ^[2]

Electron Optica Inc., Palo Alto, Ca (United States)
McGill University, Montreal, QC (Canada)

An electron mirror-based pulse compressor design has been developed for improving the temporal resolution of dynamic/ultrafast transmission electron microscopes and ultrafast electron diffraction cameras. The improvement will enable electron microscopes and diffraction cameras to better resolve the dynamics of reactions in the areas of solid state physics, chemistry, and biology. The design utilizes a combination of mirror optics and a magnetic beam separator, which exploits the symmetry inherent in reversing the electron trajectory in the mirror in order to compress the pulse. This system can also simultaneously correct the spherical and chromatic aberration of the objective lens for improved spatial resolution. For pulsed experiments with a practical bunch charge, the correction of the chromatic aberration coefficient counters the spread in the electron energies induced by the space charge of the pulse to make possible the probing of the sample with high spatial resolution. The pulse compressor can accommodate pulses with a range of electron densities and energy spreads. Additionally, it is designed to fit into both ultrafast electron diffraction cameras and dynamic/ultrafast transmission electron microscopes. Consequently, this instrument is suitable for enhancing the study of the structure, composition, and bonding states of new materials at ultrafast time scales.

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Research Organization:: Electron Optica, Palo Alto, CA (United States)

Sponsoring Organization:: USDOE Office of Science (SC)

Grant/Contract Number:: SC0013117

OSTI ID:: 1538884

Alternate ID(s):: OSTI ID: 1550032

Journal Information:: Ultramicroscopy, Vol. 183, Issue C; ISSN 0304-3991

Publisher:: ElsevierCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 8 works

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