Increased interference fringe visibility from the post-fabrication heat treatment of a perfect crystal silicon neutron interferometer

Heacock, B.; Arif, M.; Cory, D. G.; Gnaeupel-Herold, T.; Haun, R.; Huber, M. G.; Jamer, M. E.; Nsofini, J.; Pushin, D. A.; Sarenac, D.; Taminiau, I.; Young, A. R.

doi:10.1063/1.5008273

Title: Increased interference fringe visibility from the post-fabrication heat treatment of a perfect crystal silicon neutron interferometer

Journal Article · Thu Feb 08 00:00:00 EST 2018 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.5008273· OSTI ID:1526027

^[1]; Arif, M. ^[2]; Cory, D. G. ^[3];

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^[4];

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^[5]; Pushin, D. A. ^[5]; Sarenac, D. ^[5]; Taminiau, I. ^[6]; Young, A. R. ^[1]

North Carolina State Univ., Raleigh, NC (United States); Triangle Univ. Nuclear Lab, Durham, NC (United States)
National Inst. of Standards and Technology (NIST), Gaithersburg, MD (United States)
Univ. of Waterloo, Waterloo, ON (Canada); Perimeter Inst. for Theoretical Physics, Waterloo, ON (Canada); Canadian Inst. for Advanced Research, Toronto, ON (Canada)
Tulane Univ., New Orleans, LA (United States)
Univ. of Waterloo, Waterloo, ON (Canada)
Quantum Valley Investments, Waterloo, ON (Canada)

We find that annealing a previously chemically etched interferometer at 800 °C dramatically increased the interference fringe visibility from 23% to 90%. The Bragg plane misalignments were also measured before and after annealing using neutron rocking curves, showing that Bragg plane alignment was improved across the interferometer after annealing. Furthermore, this suggests that current interferometers with low fringe visibility may be salvageable and that annealing may become an important step in the fabrication process of future neutron interferometers, leading to less need for chemical etching and larger more exotic neutron interferometers.

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Research Organization:: North Carolina State University, Raleigh, NC (United States)

Sponsoring Organization:: USDOE

Grant/Contract Number:: FG02-97ER41042

OSTI ID:: 1526027

Alternate ID(s):: OSTI ID: 1419910

Journal Information:: Review of Scientific Instruments, Vol. 89, Issue 2; ISSN 0034-6748

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 3 works

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