Characterization and Compensation of High Speed Digitizers

Conference · Mon Apr 04 00:00:00 EDT 2005

DOI:https://doi.org/10.1109/IMTC.2005.1604149· OSTI ID:15016329

Fong, P; Teruya, A; Lowry, M

Increasingly, ADC technology is being pressed into service for single single-shot instrumentation applications that were formerly served by vacuum-tube based oscilloscopes and streak cameras. ADC technology, while convenient, suffers significant performance impairments. Thus, in these demanding applications, a quantitative and accurate representation of these impairments is critical to an understanding of measurement accuracy. We have developed a phase-plane behavioral model, implemented it in SIMULINK and applied it to interleaved, high-speed ADCs (up to 4 gigasamples/sec). We have also developed and demonstrated techniques to effectively compensate for these impairments based upon the model.

• Research Organization: Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
• Sponsoring Organization: US Department of Energy (US)
• DOE Contract Number: W-7405-ENG-48
• OSTI ID: 15016329
• Report Number(s): UCRL-PROC-211090; TRN: US200513%%135
• Resource Relation: Journal Volume: 1; Conference: Presented at: IMTC 2005 Instrumentation and Measurement Technology Conference, Ottawa, Ontario (CA), 05/17/2005--05/19/2005; Other Information: PBD: 4 Apr 2005
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ACCURACY
DIGITIZERS
PERFORMANCE
STREAK CAMERAS
VELOCITY