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Title: Residual stress determination in oxide layers at different length scales combining Raman spectroscopy and X-ray diffraction: Application to chromia-forming metallic alloys

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.4990146· OSTI ID:1439223
 [1];  [1];  [2];  [3]; ORCiD logo [4];  [4];  [5];  [6];  [7];  [8]
  1. Univ. de La Rochelle (France)
  2. Institut Jean Lamour, CNRS-Université de Lorraine, Nancy, France
  3. LASMIS, CNRS-Université Technologique de Troyes, Troyes, France
  4. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
  5. European Synchrotron Radiation Facility (ESRF), Grenoble (France)
  6. Univ. Grenoble Alpes (France)
  7. Synchrotron SOLEIL, Gif sur Yvette (France)
  8. CNRS-Université de Poitiers-ENSMA, Poitiers (France)
+ Show Author Affiliations

In oxidizing environments, the protection of metals and alloys against further oxidation at high temperature is provided by the oxide film itself. This protection is efficient only if the formed film adheres well to the metal (substrate), i.e., without microcracks and spalls induced by thermomechanical stresses. In this study, the residual stresses at both macroscopic and microscopic scales in the oxide film adhering to the substrate and over the damaged areas have been rigorously determined on the same samples for both techniques. Ni-30Cr and Fe-47Cr alloys have been oxidized together at 900 and 1000 °C, respectively, to create films with a thickness of a few microns. A multi-scale approach was adopted: macroscopic stress was determined by conventional X-ray diffraction and Raman spectroscopy, while microscopic residual stress mappings were performed over different types of bucklings using Raman micro-spectroscopy and synchrotron micro-diffraction. A very good agreement is found at macro- and microscales between the residual stress values obtained with both techniques, giving confidence on the reliability of the measurements. In addition, relevant structural information at the interface between the metallic substrate and the oxide layer was collected by micro-diffraction, a non-destructive technique that allows mapping through the oxide layer, and both the grain size and the crystallographic orientation of the supporting polycrystalline metal located either under a buckling or not were measured.

Research Organization:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
Grant/Contract Number:
AC02-05CH11231
OSTI ID:
1439223
Journal Information:
Journal of Applied Physics, Vol. 122, Issue 19; Related Information: © 2017 Author(s).; ISSN 0021-8979
Publisher:
American Institute of Physics (AIP)Copyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 7 works
Citation information provided by
Web of Science

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Figures / Tables (14)

TABLE I(p. 5)table TABLE I
TABLE II(p. 5)table TABLE II
FIG. 1(p. 6)figure FIG. 1
FIG. 2(p. 6)figure FIG. 2
FIG. 3(p. 6)figure FIG. 3
TABLE III(p. 7)table TABLE III
TABLE IV(p. 7)table TABLE IV
FIG. 4(p. 8)figure FIG. 4
TABLE V(p. 8)table TABLE V
FIG. 5(p. 9)figure FIG. 5
FIG. 6(p. 9)figure FIG. 6
FIG. 7(p. 9)figure FIG. 7
FIG. 8(p. 10)figure FIG. 8
FIG. 9(p. 10)figure FIG. 9

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