Dependence of the Back-streaming Ion Current on the Self-magnetic pinch (SMP) Electron Diode Parameters.

Conference · Sun May 01 00:00:00 EDT 2016

OSTI ID:1368854

Mazarakis, Michael G.; Cuneo, Michael E.; Fournier, Sean Donovan; Johnston, Mark D.; Kiefer, Mark L.; Leckbee, Joshua; Nielsen, Dan S.; Renk, Timothy J.; Ruiz, Carlos L.; Simpson, Sean; Webb, Timothy Jay; Ziska, Derek; Nichelle, Bennett; Robert, Obregon J.; Dale, Welch R.; Frank, Wilkins L.

Abstract not provided.

• Research Organization: Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
• Sponsoring Organization: USDOE National Nuclear Security Administration (NNSA)
• DOE Contract Number: AC04-94AL85000
• OSTI ID: 1368854
• Report Number(s): SAND2016-5059C; 640894
• Resource Relation: Conference: Proposed for presentation at the 43rd IEEE International Conference on Plasma Science held June 19-23, 2016 in Banff, Alberta, Canada.
• Country of Publication: United States
• Language: English