Method and apparatus for wavefront sensing

Bahk, Seung-Whan

Title: Method and apparatus for wavefront sensing

Patent · Tue Aug 23 00:00:00 EDT 2016

OSTI ID:1303529

Bahk, Seung-Whan

A method of measuring characteristics of a wavefront of an incident beam includes obtaining an interferogram associated with the incident beam passing through a transmission mask and Fourier transforming the interferogram to provide a frequency domain interferogram. The method also includes selecting a subset of harmonics from the frequency domain interferogram, individually inverse Fourier transforming each of the subset of harmonics to provide a set of spatial domain harmonics, and extracting a phase profile from each of the set of spatial domain harmonics. The method further includes removing phase discontinuities in the phase profile, rotating the phase profile, and reconstructing a phase front of the wavefront of the incident beam.

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Research Organization:: RAM PHOTONICS, LLC, San Diego, CA (United States)

Sponsoring Organization:: USDOE

DOE Contract Number:: FC52-08NA28302

Assignee:: RAM PHOTONICS, LLC (San Diego, CA)

Patent Number(s):: 9,423,306

Application Number:: 14/587,392

OSTI ID:: 1303529

Resource Relation:: Patent File Date: 2014 Dec 31

Country of Publication:: United States

Language:: English

References (15)

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