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Title: Method for enhancing the solubility of dopants in silicon

Patent ·
OSTI ID:1174513

A method for enhancing the equilibrium solid solubility of dopants in silicon, germanium and silicon-germanium alloys. The method involves subjecting silicon-based substrate to biaxial or compression strain. It has been determined that boron solubility was largely enhanced (more than 100%) by a compressive bi-axial strain, based on a size-mismatch theory since the boron atoms are smaller than the silicon atoms. It has been found that the large enhancement or mixing properties of dopants in silicon and germanium substrates is primarily governed by their, and to second order by their size-mismatch with the substrate. Further, it has been determined that the dopant solubility enhancement with strain is most effective when the charge and the size-mismatch of the impurity favor the same type of strain. Thus, the solid solubility of small p-type (e.g., boron) as well as large n-type (e.g., arsenic) dopants can be raised most dramatically by appropriate bi-axial (compressive) strain, and that solubility of a large p-type dopant (e.g, indium) in silicon will be raised due to size-mismatch with silicon, which favors tensile strain, while its negative charge prefers compressive strain, and thus the two effects counteract each other.

Research Organization:
The Regents of the University of California, Oakland, CA (United States),; Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
W-7405-ENG48
Assignee:
The Regents of the University of California (Oakland, CA)
Patent Number(s):
6,627,522
Application Number:
09/945,878
OSTI ID:
1174513
Country of Publication:
United States
Language:
English

References (6)

Point defects and dopant diffusion in silicon journal April 1989
Inhomogeneous Electron Gas journal November 1964
Self-Consistent Equations Including Exchange and Correlation Effects journal November 1965
Mechanism of Boron Diffusion in Silicon: An Ab Initio and Kinetic Monte Carlo Study journal November 1999
DEVICE PHYSICS:Pushing the Limits journal September 1999
Evidence for Substitutional C, Ordering Effects and Interdiffusion in Epitaxial GE-C and GE-RICH GE-SI-C Alloys journal January 1998