Optical Sideband Generation: a Longitudinal Electron Beam Diagnostic Beyond the Laser Bandwidth Resolution Limit

Conference · Tue Jun 01 00:00:00 EDT 2010

OSTI ID:1022733

Tilborg, J van; Matlis, N H; Plateau, G R; Leemans, W P

Electro-optic sampling (EOS) is widely used as a technique to measure THz-domain electric field pulses such asthe self-fields of femtosecond electron beams. We present an EOS-based approach for single-shot spectral measurement that excels in simplicity (compatible with fiber integration) and bandwidth coverage (overcomes the laser bandwidth limitation), allowing few-fs electron beams or single-cycle THz pulses to be characterized with conventional picosecond probes. It is shown that the EOS-induced optical sidebands on the narrow-bandwidth optical probe are spectrally-shifted replicas of the THz pulse. An experimental demonstration on a 0-3 THz source is presented.

• Research Organization: Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
• Sponsoring Organization: Accelerator& Fusion Research Division
• DOE Contract Number: DE-AC02-05CH11231
• OSTI ID: 1022733
• Report Number(s): LBNL-4645E; TRN: US1104477
• Resource Relation: Conference: 2010 Advanced Accelerator Concepts Workshop, Annapolis, MD, June 13 - 19, 2010
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
ACCELERATORS
ELECTRIC FIELDS
ELECTRON BEAMS
FIBERS
LASERS
PROBES
REPLICAS
RESOLUTION
SAMPLING
Beam diagnostics
electro-optic sampling
ultra-short electron beams