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Title: Center for X-Ray Optics, 1992

Technical Report ·
DOI:https://doi.org/10.2172/10187184· OSTI ID:10187184

This report discusses the following topics: Center for X-Ray Optics; Soft X-Ray Imaging wit Zone Plate Lenses; Biological X-Ray microscopy; Extreme Ultraviolet Lithography for Nanoelectronic Pattern Transfer; Multilayer Reflective Optics; EUV/Soft X-ray Reflectometer; Photoemission Microscopy with Reflective Optics; Spectroscopy with Soft X-Rays; Hard X-Ray Microprobe; Coronary Angiography; and Atomic Scattering Factors.

Research Organization:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Organization:
USDOE, Washington, DC (United States); Department of Defense, Washington, DC (United States)
DOE Contract Number:
AC03-76SF00098
OSTI ID:
10187184
Report Number(s):
LBL-34462; ON: DE94000726; CNN: Contract F49620-84-K-0001; TRN: 93:021936
Resource Relation:
Other Information: PBD: Aug 1993
Country of Publication:
United States
Language:
English