Crystallography of Co/Pt multilayers and nanostructures
- Lawrence Berkeley Lab., CA (United States)
- IBM Research Div., San Jose, CA (United States). Almaden Research Center
Atomically engineered nanostructures and multilayers of Co/Pt exhibit strong perpendicular anisotropy. This unique property, that determines their potential as a magneto-optic recording media, is dependent on a variety of microstructural parameters that include the overall crystallography, thickness of the layers, orientation, defect formation, interface reactions etc. A series of Co/Pt multilayer samples with different thickness of the Co layer were studied by electron diffraction. It has been determined that the Co layers persists in the fcc structure up to a thickness of 50 {Angstrom}. As the thickness is varied fmm 3{Angstrom} to 50{Angstrom} in the multilayers, the Co film gradually relaxed to its bulk lattice parameter. (111) twinning and lattice strain at the interfaces between Pt and Co layers are also observed. The symmetry forbidden reflections observed at 1/3 (224) positions in (111) zone diffraction patterns of the multilayer are due to (111) twinning and compositional modulations along the multilayer growth direction.
- Research Organization:
- Lawrence Berkeley Lab., CA (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- AC03-76SF00098
- OSTI ID:
- 10181752
- Report Number(s):
- LBL-32290; CONF-920450-1; ON: DE92041212
- Resource Relation:
- Conference: 4. conference on frontiers of electron microscopy in materials science,Oakland, CA (United States),21-24 Apr 1992; Other Information: PBD: Apr 1992
- Country of Publication:
- United States
- Language:
- English
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