S-parameter test set for pulsed networks
A scattering parameter test set that operates in a pulsed mode for analyzing RF/microwave networks has been developed. Designed for analyzing various components of accelerator RF systems, the test set is applicable to a variety of components at different frequencies. The test set consists of an embedded processor, a tracking downconverter, a dual channel vector detector, a timing distribution module, a pulse generator, and a signal generator. The majority of the hardware is packaged in the modular VXlbus architecture, and the control software is National Instruments` LabVIEW{copyright}. Measurements of systems have been made centered around 425 MHz, 850 MHz and 1300 MHz, although other frequency regimes are available. This test set sweeps frequency and amplitude levels while measuring the in-phase and quadrature components of the incident, reflected, and transmitted signals. With this system, gain and phase measurements have been made on high-power amplifiers transmission lines, and low-level control systems individually and as a combined entity. In addition, utilization of this system for material characterization (e.g., microwave absorption versus frequency, amplitude, temperature, pressure, etc.) is planned. This paper will discuss the test set architecture, implementation, and present typical results obtained measuring pulsed components.
- Research Organization:
- Los Alamos National Lab., NM (United States)
- Sponsoring Organization:
- Department of Defense, Washington, DC (United States)
- DOE Contract Number:
- W-7405-ENG-36
- OSTI ID:
- 10179897
- Report Number(s):
- LA-UR-94-2763; CONF-941231-1; ON: DE94018096
- Resource Relation:
- Conference: IEEE microwave theory and techniques society meeting,Boulder, CO (United States),1-2 Dec 1994; Other Information: PBD: [1994]
- Country of Publication:
- United States
- Language:
- English
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