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Title: Acoustic microscopy with mixed-mode transducers

Conference ·
OSTI ID:10155292

The new amplitude-phase acoustic microscope is versatile; it operates in a wide frequency range 1--200 MHz, with selection of longitudinal, shear, and mixed modes. This enables it to be used in many NDE applications for different kinds of materials. Besides the application examples presented in this paper (bulk defect imaging of lossy materials or at deep locations; leads of IC chip in epoxy package; amplitude images of surface crack on Si nitride ball bearing; thin Au film on quartz), this system can also be applied for residual stress and anisotropy mapping with high accuracy and good spatial resolution. 7 refs, 6 figs.

Research Organization:
Stanford Univ., CA (United States)
Sponsoring Organization:
USDOE, Washington, DC (United States)
DOE Contract Number:
FG03-84ER45157
OSTI ID:
10155292
Report Number(s):
CONF-880760-12; ON: DE94012344; BR: KC0201050
Resource Relation:
Conference: 15. annual review of progress in quantitative nondestructive evaluation,La Jolla, CA (United States),31 Jul - 5 Aug 1988; Other Information: PBD: [1988]
Country of Publication:
United States
Language:
English