High resolution energy loss research: Si compound ceramics and composites. [1990 annual progress report]

Technical Report · Mon Dec 31 00:00:00 EST 1990

DOI:https://doi.org/10.2172/10116436· OSTI ID:10116436

Carpenter, R W; Lin, S H

This report discusses proposed work on silicon compound ceramics and composites. High resolution composition and structure analysis of interfaces in ceramic and metal matrix composites and certain grain boundaries in silicon and its interfaces with oxides and nitrides is proposed. Composition and bonding analysis will be done with high spatial resolution (20 Angstroms or better) parallel electron energy loss spectroscopy using a field emission analytical electron microscope. Structural analysis will be done at the 1.8 Angstrom resolution level at 200kV by HREM. Theoretical electron energy loss cross section computations will be used to interpret electronic structure of these materials. Both self-consistent field MO and multiple scattering computational methods are being done and evaluated.

• Research Organization: Arizona State Univ., Tempe, AZ (United States)
• Sponsoring Organization: USDOE, Washington, DC (United States)
• DOE Contract Number: FG02-87ER45305
• OSTI ID: 10116436
• Report Number(s): DOE/ER/45305-3; ON: DE92007119
• Resource Relation: Other Information: PBD: [1990]
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
SILICON COMPOUNDS
ENERGY-LOSS SPECTROSCOPY
STRUCTURAL CHEMICAL ANALYSIS
CERAMICS
INTERFACES
PROGRESS REPORT
SILICON CARBIDES
SILICON NITRIDES
ALUMINIUM OXIDES
CHEMICAL COMPOSITION
ELECTRONIC STRUCTURE
GRAIN BOUNDARIES
RADIATION EFFECTS
FILMS
ELECTRON MICROSCOPY
COMPOSITE MATERIALS
360602
360606
STRUCTURE AND PHASE STUDIES
PHYSICAL PROPERTIES