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Title: Conductivity and mobility profiles at 300 and 77 K of epitaxial Cd/sub chi/Hg/sub 1-chi/Te layers

Journal Article · · Journal of the Electrochemical Society; (USA)
DOI:https://doi.org/10.1149/1.2096966· OSTI ID:5147525
; ; ;  [1]
  1. GEC Research, Ltd., Hirst Research Centre, Wembley, Middlesex (GB)

The authors report the results of conductivity and mobility profiles of expitaxial layers of Cd/sub chi/Hg/sub 1-chi/Te at 300 and 77 {Kappa} obtained using the step and etch technique. In this technique, layers are sequentially stripped through chemical etching and differential Hall measurements are performed in the van der Pauw configuration.

OSTI ID:
5147525
Journal Information:
Journal of the Electrochemical Society; (USA), Vol. 136:5; ISSN 0013-4651
Country of Publication:
United States
Language:
English

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