A negative ion source test facility

Journal Article · Mon Feb 15 00:00:00 EST 2016 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4932320· OSTI ID:22482931

Melanson, S.; Potkins, D.; Theroux, J.; Hollinger, C.; Martin, J.; Stewart, T.; Jackle, P.; Withington, S. ^[1]; Philpott, C.; Williams, P.; Brown, S.; Jones, T.; Coad, B. ^[2]

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1. D-Pace, Inc., P.O. Box 201, Nelson, British Columbia V1L 5P9 (Canada)
2. Buckley Systems Ltd., 6 Bowden Road, Mount Wellington, Auckland 1060 (New Zealand)

Progress is being made in the development of an Ion Source Test Facility (ISTF) by D-Pace Inc. in collaboration with Buckley Systems Ltd. in Auckland, NZ. The first phase of the ISTF is to be commissioned in October 2015 with the second phase being commissioned in March 2016. The facility will primarily be used for the development and the commercialization of ion sources. It will also be used to characterize and further develop various D-Pace Inc. beam diagnostic devices.

• OSTI ID: 22482931
• Journal Information: Review of Scientific Instruments, Vol. 87, Issue 2; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ANIONS
BEAMS
COMMERCIALIZATION
EQUIPMENT
TEST FACILITIES