skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Characteristics of low-energy ion beams extracted from a wire electrode geometry

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.3680105· OSTI ID:22066287
; ;  [1];  [2];  [3]
  1. Graduate School of Engineering, Doshisha University, Kyotanabe, Kyoto 610-0321 (Japan)
  2. Novelion Systems Co. Ltd., Kyotanabe, Kyoto 610-0332 (Japan)
  3. Faculty of Life and Medical Sciences, Doshisha University, Kyotanabe, Kyoto 610-0321 (Japan)

Beams of argon ions with energies less than 50 eV were extracted from an ion source through a wire electrode extractor geometry. A retarding potential energy analyzer (RPEA) was constructed in order to characterize the extracted ion beams. The single aperture RPEA was used to determine the ion energy distribution function, the mean ion energy and the ion beam energy spread. The multi-cusp hot cathode ion source was capable of producing a low electron temperature gas discharge to form quiescent plasmas from which ion beam energy as low as 5 eV was realized. At 50 V extraction potential and 0.1 A discharge current, the ion beam current density was around 0.37 mA/cm{sup 2} with an energy spread of 3.6 V or 6.5% of the mean ion energy. The maximum ion beam current density extracted from the source was 0.57 mA/cm{sup 2} for a 50 eV ion beam and 1.78 mA/cm{sup 2} for a 100 eV ion beam.

OSTI ID:
22066287
Journal Information:
Review of Scientific Instruments, Vol. 83, Issue 2; Other Information: (c) 2012 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
Country of Publication:
United States
Language:
English

Similar Records

Generation of space charge compensated low energy ion flux
Journal Article · Fri Feb 15 00:00:00 EST 2008 · Review of Scientific Instruments · OSTI ID:22066287

Ion source with low voltage extraction using glow discharge
Conference · Tue Jan 01 00:00:00 EST 1974 · OSTI ID:22066287

Integrated silicon grid ion extraction system for O sub 2 processes
Journal Article · Thu Nov 01 00:00:00 EST 1990 · Journal of Vacuum Science and Technology, B: Microelectronics Processing and Phenomena; (USA) · OSTI ID:22066287