Polychromatic X-ray Micro- and Nano-Beam Science and Instrumentation
- Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge TN 37831-6118 (United States)
- Advanced Photon Source, Argonne National Laboratory, 9700 S. Cass Ave. Argonne Il 60439 (United States)
Polychromatic x-ray micro- and nano-beam diffraction is an emerging nondestructive tool for the study of local crystalline structure and defect distributions. Both long-standing fundamental materials science issues, and technologically important questions about specific materials systems can be uniquely addressed. Spatial resolution is determined by the beam size at the sample and by a knife-edge technique called differential aperture microscopy that decodes the origin of scattering from along the penetrating x-ray beam. First-generation instrumentation on station 34-ID-E at the Advanced Photon Source (APS) allows for nondestructive automated recovery of the three-dimensional (3D) local crystal phase and orientation. Also recovered are the local elastic-strain and the dislocation tensor distributions. New instrumentation now under development will further extend the applications of polychromatic microdiffraction and will revolutionize materials characterization.
- OSTI ID:
- 21049263
- Journal Information:
- AIP Conference Proceedings, Vol. 879, Issue 1; Conference: 9. international conference on synchrotron radiation instrumentation, Daegu (Korea, Republic of), 28 May - 2 Jun 2006; Other Information: DOI: 10.1063/1.2436302; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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