Polychromatic X-ray Micro- and Nano-Beam Science and Instrumentation

Conference · Mon Jan 01 00:00:00 EST 2007

OSTI ID:931853

Ice, Gene E ^[1]; Larson, Ben C ^[1]; Liu, Wenjun ^[1]; Barabash, Rozaliya ^[1]; Specht, Eliot D ^[1]; Pang, Judy ^[1]; Budai, John D ^[1]; Tischler, Jonathan Zachary ^[1]; Khounsary, Ali ^[2]; Liu, Chian ^[2]; Macrander, Albert T. ^[2]; Assoufid, Lahsen ^[2]

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1. ORNL
2. Argonne National Laboratory (ANL)

Polychromatic x-ray micro- and nano-beam diffraction is an emerging nondestructive tool for the study of local crystalline structure and defect distributions. Both long-standing fundamental materials science issues, and technologically important questions about specific materials systems can be uniquely addressed. Spatial resolution is determined by the beam size at the sample and by a knife-edge technique called differential aperture microscopy that decodes the origin of scattering from along the penetrating x-ray beam. First-generation instrumentation on station 34-ID-E at the Advanced Photon Source (APS) allows for nondestructive automated recovery of the three-dimensional (3D) local crystal phase and orientation. Also recovered are the local elastic-strain and the dislocation tensor distributions. New instrumentation now under development will further extend the applications of polychromatic microdiffraction and will revolutionize materials characterization.

• Research Organization: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
• Sponsoring Organization: USDOE Office of Science (SC)
• DOE Contract Number: DE-AC05-00OR22725
• OSTI ID: 931853
• Resource Relation: Conference: Ninth International Conference on Synchrotron Radiation Instrumentation (SRI 2006), Daegu, South Korea, 20060527, 20060531
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
ADVANCED PHOTON SOURCE
APERTURES
DEFECTS
X-RAY DIFFRACTION
DISLOCATIONS
MICROSCOPY
ORIENTATION
ORIGIN
SCATTERING
SPATIAL RESOLUTION
SYNCHROTRON RADIATION