Two-photon laser-assisted device alteration in CMOS integrated circuits using linearly, circularly and radially polarized light
- Authors:
- Publication Date:
- Sponsoring Org.:
- USDOE National Nuclear Security Administration (NNSA)
- OSTI Identifier:
- 1333579
- Grant/Contract Number:
- NA0001944
- Resource Type:
- Publisher's Accepted Manuscript
- Journal Name:
- Microelectronics and Reliability
- Additional Journal Information:
- Journal Name: Microelectronics and Reliability Journal Volume: 60 Journal Issue: C; Journal ID: ISSN 0026-2714
- Publisher:
- Elsevier
- Country of Publication:
- United Kingdom
- Language:
- English
Citation Formats
Rutkauskas, M., Farrell, C., Dorrer, C., Marshall, K. L., Crawford, T., Lundquist, T. R., Vedagarbha, P., Erington, K., Bodoh, D., and Reid, D. T. Two-photon laser-assisted device alteration in CMOS integrated circuits using linearly, circularly and radially polarized light. United Kingdom: N. p., 2016.
Web. doi:10.1016/j.microrel.2016.02.007.
Rutkauskas, M., Farrell, C., Dorrer, C., Marshall, K. L., Crawford, T., Lundquist, T. R., Vedagarbha, P., Erington, K., Bodoh, D., & Reid, D. T. Two-photon laser-assisted device alteration in CMOS integrated circuits using linearly, circularly and radially polarized light. United Kingdom. https://doi.org/10.1016/j.microrel.2016.02.007
Rutkauskas, M., Farrell, C., Dorrer, C., Marshall, K. L., Crawford, T., Lundquist, T. R., Vedagarbha, P., Erington, K., Bodoh, D., and Reid, D. T. Sun .
"Two-photon laser-assisted device alteration in CMOS integrated circuits using linearly, circularly and radially polarized light". United Kingdom. https://doi.org/10.1016/j.microrel.2016.02.007.
@article{osti_1333579,
title = {Two-photon laser-assisted device alteration in CMOS integrated circuits using linearly, circularly and radially polarized light},
author = {Rutkauskas, M. and Farrell, C. and Dorrer, C. and Marshall, K. L. and Crawford, T. and Lundquist, T. R. and Vedagarbha, P. and Erington, K. and Bodoh, D. and Reid, D. T.},
abstractNote = {},
doi = {10.1016/j.microrel.2016.02.007},
journal = {Microelectronics and Reliability},
number = C,
volume = 60,
place = {United Kingdom},
year = {Sun May 01 00:00:00 EDT 2016},
month = {Sun May 01 00:00:00 EDT 2016}
}
Free Publicly Available Full Text
Publisher's Version of Record
https://doi.org/10.1016/j.microrel.2016.02.007
https://doi.org/10.1016/j.microrel.2016.02.007
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Cited by: 1 work
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