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Title: High-resolution ab initio three-dimensional x-ray diffraction microscopy

Abstract

Coherent x-ray diffraction microscopy is a method of imaging nonperiodic isolated objects at resolutions limited, in principle, by only the wavelength and largest scattering angles recorded. We demonstrate x-ray diffraction imaging with high resolution in all three dimensions, as determined by a quantitative analysis of the reconstructed volume images. These images are retrieved from the three-dimensional diffraction data using no a priori knowledge about the shape or composition of the object, which has never before been demonstrated on a nonperiodic object. We also construct two-dimensional images of thick objects with greatly increased depth of focus (without loss of transverse spatial resolution). These methods can be used to image biological and materials science samples at high resolution with x-ray undulator radiation and establishes the techniques to be used in atomic-resolution ultrafast imaging at x-ray free-electron laser sources.

Authors:
 [1];  [1];  [1];  [1];  [2];  [2];  [2];  [2];  [3];  [3];  [3];  [4];  [4];  [4]
  1. Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
  2. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
  3. Arizona State Univ., Tempe, AZ (United States) Dept. Physics and Astronomy
  4. Stony Brook Univ., NY (United States) Dept. Physics and Astronomy
Publication Date:
Research Org.:
Stony Brook Univ., NY (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
OSTI Identifier:
1164141
Grant/Contract Number:  
FG02-04ER46128
Resource Type:
Accepted Manuscript
Journal Name:
Journal of the Optical Society of America. A, Optics, Image Science, and Vision
Additional Journal Information:
Journal Volume: 23; Journal Issue: 5; Journal ID: ISSN 1084-7529
Publisher:
Optical Society of America (OSA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 77 NANOSCIENCE AND NANOTECHNOLOGY

Citation Formats

Chapman, Henry N., Barty, Anton, Marchesini, Stefano, Noy, Aleksandr, Hau-Riege, Stefan P., Cui, Congwu, Howells, Malcolm R., Rosen, Rachel, He, Haifeng, Spence, John C. H., Weierstall, Uwe, Beetz, Tobias, Jacobsen, Chris, and Shapiro, David. High-resolution ab initio three-dimensional x-ray diffraction microscopy. United States: N. p., 2006. Web. doi:10.1364/JOSAA.23.001179.
Chapman, Henry N., Barty, Anton, Marchesini, Stefano, Noy, Aleksandr, Hau-Riege, Stefan P., Cui, Congwu, Howells, Malcolm R., Rosen, Rachel, He, Haifeng, Spence, John C. H., Weierstall, Uwe, Beetz, Tobias, Jacobsen, Chris, & Shapiro, David. High-resolution ab initio three-dimensional x-ray diffraction microscopy. United States. https://doi.org/10.1364/JOSAA.23.001179
Chapman, Henry N., Barty, Anton, Marchesini, Stefano, Noy, Aleksandr, Hau-Riege, Stefan P., Cui, Congwu, Howells, Malcolm R., Rosen, Rachel, He, Haifeng, Spence, John C. H., Weierstall, Uwe, Beetz, Tobias, Jacobsen, Chris, and Shapiro, David. Sun . "High-resolution ab initio three-dimensional x-ray diffraction microscopy". United States. https://doi.org/10.1364/JOSAA.23.001179. https://www.osti.gov/servlets/purl/1164141.
@article{osti_1164141,
title = {High-resolution ab initio three-dimensional x-ray diffraction microscopy},
author = {Chapman, Henry N. and Barty, Anton and Marchesini, Stefano and Noy, Aleksandr and Hau-Riege, Stefan P. and Cui, Congwu and Howells, Malcolm R. and Rosen, Rachel and He, Haifeng and Spence, John C. H. and Weierstall, Uwe and Beetz, Tobias and Jacobsen, Chris and Shapiro, David},
abstractNote = {Coherent x-ray diffraction microscopy is a method of imaging nonperiodic isolated objects at resolutions limited, in principle, by only the wavelength and largest scattering angles recorded. We demonstrate x-ray diffraction imaging with high resolution in all three dimensions, as determined by a quantitative analysis of the reconstructed volume images. These images are retrieved from the three-dimensional diffraction data using no a priori knowledge about the shape or composition of the object, which has never before been demonstrated on a nonperiodic object. We also construct two-dimensional images of thick objects with greatly increased depth of focus (without loss of transverse spatial resolution). These methods can be used to image biological and materials science samples at high resolution with x-ray undulator radiation and establishes the techniques to be used in atomic-resolution ultrafast imaging at x-ray free-electron laser sources.},
doi = {10.1364/JOSAA.23.001179},
journal = {Journal of the Optical Society of America. A, Optics, Image Science, and Vision},
number = 5,
volume = 23,
place = {United States},
year = {Sun Jan 01 00:00:00 EST 2006},
month = {Sun Jan 01 00:00:00 EST 2006}
}

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Electron Nanodiffraction
book, January 2019


Three-dimensional structure determination from a single view
journal, December 2009

  • Raines, Kevin S.; Salha, Sara; Sandberg, Richard L.
  • Nature, Vol. 463, Issue 7278
  • DOI: 10.1038/nature08705

Ultrafast single-shot diffraction imaging of nanoscale dynamics
journal, June 2008


Room temperature giant magnetostriction in single-crystal nickel nanowires
journal, October 2019


Single-shot diffraction data from the Mimivirus particle using an X-ray free-electron laser
journal, August 2016

  • Ekeberg, Tomas; Svenda, Martin; Seibert, M. Marvin
  • Scientific Data, Vol. 3, Issue 1
  • DOI: 10.1038/sdata.2016.60

Simultaneous cryo X-ray ptychographic and fluorescence microscopy of green algae
journal, February 2015

  • Deng, Junjing; Vine, David J.; Chen, Si
  • Proceedings of the National Academy of Sciences, Vol. 112, Issue 8
  • DOI: 10.1073/pnas.1413003112

Aerosol Imaging with a Soft X-Ray Free Electron Laser
journal, February 2010

  • Bogan, Michael J.; Boutet, Sébastien; Chapman, Henry N.
  • Aerosol Science and Technology, Vol. 44, Issue 3
  • DOI: 10.1080/02786820903485800

The history and future of X-ray microscopy
journal, September 2009


Bragg projection ptychography on niobium phase domains
text, January 2017

  • Burdet, Nicolas; Shi, Xiaowen; Clark, Jesse N.
  • Deutsches Elektronen-Synchrotron, DESY, Hamburg
  • DOI: 10.3204/pubdb-2018-00378

Single-particle imaging without symmetry constraints at an X-ray free-electron laser
text, January 2018

  • Rose, Max; Bobkov, Sergey; Ayyer, Kartik
  • Deutsches Elektronen-Synchrotron, DESY, Hamburg
  • DOI: 10.3204/pubdb-2018-03083

X-ray ptychographic computed tomography at 16 nm isotropic 3D resolution
text, January 2014


Considerations for three-dimensional image reconstruction from experimental data in coherent diffractive imaging
text, January 2018


Practical algorithms for simulation and reconstruction of digital in-line holograms
text, January 2015

  • Latychevskaia, Tatiana; Fink, Hans-Werner
  • Optical Society of America
  • DOI: 10.5167/uzh-109953

Time-domain ptychography
text, January 2015

  • Rohwer, Erich; Neethling, Pieter; Feurer, Thomas
  • American Physical Society
  • DOI: 10.7892/boris.74987

Nanotomography in the Chemical, Biological and Materials Sciences
journal, December 2007

  • Midgley, Paul A.; Ward, Edmund P. W.; Hungria, Ana B.
  • ChemInform, Vol. 38, Issue 49
  • DOI: 10.1002/chin.200749279

Single-particle XFEL 3D reconstruction of ribosome-size particles based on Fourier slice matching: requirements to reach subnanometer resolution
journal, May 2018

  • Nakano, Miki; Miyashita, Osamu; Jonic, Slavica
  • Journal of Synchrotron Radiation, Vol. 25, Issue 4
  • DOI: 10.1107/s1600577518005568

Beyond crystallography: Diffractive imaging using coherent x-ray light sources
journal, April 2015


Versatility of a hard X-ray Kirkpatrick-Baez focus characterized by ptychography
text, January 2013

  • Giewekemeyer, K.; Wilke, R. N.; Osterhoff, M.
  • Deutsches Elektronen-Synchrotron, DESY, Hamburg
  • DOI: 10.3204/phppubdb-26500

A comprehensive simulation framework for imaging single particles and biomolecules at the European X-ray Free-Electron Laser
text, January 2016

  • Yoon, Chun Hong; Yurkov, Mikhail; Schneidmiller, Evgeny Alexanrdovich
  • Deutsches Elektronen-Synchrotron, DESY, Hamburg
  • DOI: 10.3204/pubdb-2016-01805

Real-time coherent diffraction inversion using deep generative networks
journal, November 2018

  • Cherukara, Mathew J.; Nashed, Youssef S. G.; Harder, Ross J.
  • Scientific Reports, Vol. 8, Issue 1
  • DOI: 10.1038/s41598-018-34525-1

Design of a liquid cell toward three-dimensional imaging of unidirectionally-aligned particles in solution using X-ray free-electron lasers
journal, January 2020

  • Suzuki, Akihiro; Kimura, Takashi; Yang, Ying
  • Physical Chemistry Chemical Physics, Vol. 22, Issue 5
  • DOI: 10.1039/c9cp03658j

Towards a quantitative determination of strain in Bragg Coherent X-ray Diffraction Imaging: artefacts and sign convention in reconstructions
text, January 2019

  • Carnis, Jerome; Gao, Lu; Labat, Stéphane
  • Deutsches Elektronen-Synchrotron, DESY, Hamburg
  • DOI: 10.3204/pubdb-2020-00283

Open data set of live cyanobacterial cells imaged using an X-ray laser
journal, August 2016

  • van der Schot, Gijs; Svenda, Martin; Maia, Filipe R. N. C.
  • Scientific Data, Vol. 3, Issue 1
  • DOI: 10.1038/sdata.2016.58

Structure Determination by Continuous Diffraction from Imperfect Crystals
text, January 2018

  • Ayyer, Kartik; Yefanov, Oleksandr; Chapman, Henry N.
  • Deutsches Elektronen-Synchrotron, DESY, Hamburg
  • DOI: 10.3204/pubdb-2019-00073

High Speed and High Resolution Table-Top Nanoscale Imaging
text, January 2016


Sparse recovery of undersampled intensity patterns for coherent diffraction imaging at high X-ray energies
text, January 2017