Sample holder with optical features
Abstract
A sample holder for holding a sample to be observed for research purposes, particularly in a transmission electron microscope (TEM), generally includes an external alignment part for directing a light beam in a predetermined beam direction, a sample holder body in optical communication with the external alignment part and a sample support member disposed at a distal end of the sample holder body opposite the external alignment part for holding a sample to be analyzed. The sample holder body defines an internal conduit for the light beam and the sample support member includes a light beam positioner for directing the light beam between the sample holder body and the sample held by the sample support member.
- Inventors:
- Issue Date:
- Research Org.:
- Brookhaven National Laboratory (BNL), Upton, NY (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1088943
- Patent Number(s):
- 8497487
- Application Number:
- 13/398,623
- Assignee:
- Brookhaven Science Associates, LLC (Upton, NY)
- Patent Classifications (CPCs):
-
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- DOE Contract Number:
- ACO2-98CH10886
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY; 47 OTHER INSTRUMENTATION
Citation Formats
Milas, Mirko, Zhu, Yimei, and Rameau, Jonathan David. Sample holder with optical features. United States: N. p., 2013.
Web.
Milas, Mirko, Zhu, Yimei, & Rameau, Jonathan David. Sample holder with optical features. United States.
Milas, Mirko, Zhu, Yimei, and Rameau, Jonathan David. Tue .
"Sample holder with optical features". United States. https://www.osti.gov/servlets/purl/1088943.
@article{osti_1088943,
title = {Sample holder with optical features},
author = {Milas, Mirko and Zhu, Yimei and Rameau, Jonathan David},
abstractNote = {A sample holder for holding a sample to be observed for research purposes, particularly in a transmission electron microscope (TEM), generally includes an external alignment part for directing a light beam in a predetermined beam direction, a sample holder body in optical communication with the external alignment part and a sample support member disposed at a distal end of the sample holder body opposite the external alignment part for holding a sample to be analyzed. The sample holder body defines an internal conduit for the light beam and the sample support member includes a light beam positioner for directing the light beam between the sample holder body and the sample held by the sample support member.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Jul 30 00:00:00 EDT 2013},
month = {Tue Jul 30 00:00:00 EDT 2013}
}
Save to My Library
You must Sign In or Create an Account in order to save documents to your library.
Works referenced in this record:
Kit for preparing a tem sample holder
patent, October 2006
- Moore, Thomas M.
- US Patent Document 7,126,133
Method of preparing a sample for examination in a TEM
patent, January 2008
- Moore, Thomas M.
- US Patent Document 7,315,023
Sample holder, sample mount and sample mount jig for use in electron microscope
patent, June 2003
- Hashikawa, Naoto; Fukumoto, Koji
- US Patent Document 6,576,910
Method and apparatus for specimen fabrication
patent, September 2007
- Shichi, Hiroyasu; Ishitani, Tohru; Koike, Hidemi
- US Patent Document 7,268,356
Method for preparing a sample for electron microscopic examinations, and sample supports and transport holders used therefor
patent, May 2008
- Burkhardt, Claus; Nisch, Wilfried
- US Patent Document 7,375,325
Specimen tip and tip holder assembly
patent-application, February 2005
- Morrison, Robert
- US Patent Application 10/903985; 20050035302
Transmission electron microscope sample holder with optical features
patent, March 2012
- Milas, Mirko; Zhu, Yimei; Rameau, Jonathan David
- US Patent Document 8,143,593