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Title: High resolution synchrotron x-ray diffraction of tomography of polycrystalline samples

Book ·
OSTI ID:99507
; ;  [1];  [2]
  1. Georgia Inst. of Tech., Atlanta, GA (United States). School of Materials Science and Engineering
  2. Stanford Univ., CA (United States). Stanford Synchrotron Radiation Lab.

The macroscopic response of polycrystalline materials to loading depends on both the spatial distribution of strain and the variation of microtexture on the scale of 100 {micro}m. Nondestructive measurements are needed if the three-dimensional evolution of strain is to be studied. this paper describes approaches for high resolution synchrotron polychromatic x-ray diffraction tomography of polycrystalline materials. Preliminary experiments are reported on partially cracked compact tension samples of Al-Li 2090 and on model samples of randomly-packed, millimeter-sized pieces of Si wafers. Polychromatic beams collimated to 100 {micro}m diameter have been used, and the distribution of diffracted intensity has been collected on high resolution x-ray film as well as on image storage plates. The depths of diffracting volume elements are determined from the changes in the spatial distribution of diffracted intensity with varying sample to detector separation.

OSTI ID:
99507
Report Number(s):
CONF-941144-; ISBN 1-55899-277-4; TRN: IM9539%%302
Resource Relation:
Conference: Fall meeting of the Materials Research Society (MRS), Boston, MA (United States), 28 Nov - 9 Dec 1994; Other Information: PBD: 1995; Related Information: Is Part Of Applications of synchrotron radiation techniques to materials science II; Terminello, L.J. [ed.] [Lawrence Livermore National Lab., CA (United States)]; Shinn, N.D. [ed.] [Sandia National Labs., Albuquerque, NM (United States)]; Ice, G.E. [ed.] [Oak Ridge National Lab., TN (United States)]; D`Amico, K.L. [ed.] [X-ray Analytics, Ltd., Hinsdale, IL (United States)]; Perry, D.L. [ed.] [Lawrence Berkeley Lab., CA (United States)]; PB: 349 p.; Materials Research Society symposium proceedings, Volume 375
Country of Publication:
United States
Language:
English