Submicron and Nanoscale X-ray Measurements of 3D Strain Tensor Distributions
- ORNL
Unprecedented three-dimensional (3D) measurements of strain tensor distributions are now possible due to an emerging class of instrumentation: the 3D x-ray crystal microscopes. These instruments use ultra-intense synchrotron x-ray sources and advanced x-ray optics to probe polycrystalline materials with submicron x-ray beams. By employing polychromatic x-ray beams and a virtually pinhole camera method called differential aperture microscopy, 3D distributions of the local crystalline phase, orientation (texture) and elastic and plastic strain tensor distributions can be measured with submicron resolution in all directions. The elastic strain tensor elements can typically be determined with resolution between 10 and 100 ppm. Orientations can be quantified to less than 0.01 degrees and the local unpaired dislocation density can be simultaneously measured. Efforts are underway to improve the spatial resolution to less than 50 nm and to extend the technique to allow for measurements deep within materials. Because the 3D x-ray crystal microscope is a penetrating nondestructive tool, it is ideal for studies of mesoscale evolution in materials. The most advanced 3D microscope currently in operation is described along with upgrades that will increase the overall performance and data aquisition rate by orders of magnitude. The unprecedented new information possible from the 3D x-ray crystal microscopes is illustrated with some recent research examples.
- Research Organization:
- Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
- Sponsoring Organization:
- USDOE
- OSTI ID:
- 1008903
- Resource Relation:
- Conference: Charlotte, NC
- Country of Publication:
- United States
- Language:
- ENGLISH
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